Test probe For 4mm Banan Sort
Varenummer:
115-872
Varekode: N-RH-PRUF2B
Vægt: 6 g
17 stk.
på lager
|
HIRSCHMANN T&M
|
||
|
probe tip
|
||
|
60V DC
|
||
|
black
|
||
|
2mm
|
||
|
4mm
|
||
|
-25...80°C
|
||
|
50mΩ
|
||
|
973368100
|
Test probe with elastic shatterproof insulated sleeve. Both insulating layers and backing layers on printed circuit boards can be penetrated by the slim stainless steel tip (7mm, bright metal) 4mm dia. socket connection made of brass.
colour:
black
Test probe For 4mm Banan Sort
115-872
/ N-RH-PRUF2B
17 stk.
på lager
|
HIRSCHMANN T&M
|
||
|
probe tip
|
||
|
60V DC
|
||
|
black
|
||
|
2mm
|
||
|
4mm
|
||
|
-25...80°C
|
||
|
50mΩ
|
||
|
973368100
|
Test probe with elastic shatterproof insulated sleeve. Both insulating layers and backing layers on printed circuit boards can be penetrated by the slim stainless steel tip (7mm, bright metal) 4mm dia. socket connection made of brass.
colour:
black